?????????? ????????? ???????? ?????????????? CdX Hg1?XTe - Zn0.04Cd0.96Te , ?? ?????????? ?????????? ? ?????? ????
Електронний архів Житомирського державного технологічного університету
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| Title |
?????????? ????????? ???????? ?????????????? CdX Hg1?XTe - Zn0.04Cd0.96Te , ?? ?????????? ?????????? ? ?????? ????
Fractal geometry of heterostructures surface - , which is formed from the liquid phase by precipitation |
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| Creator |
???????, ?.?.
??????????, ?.?. ?????????????, ?.?. ????????????, ?.?. Moskvin, P.P. Gutnichenko, ?.?. Kryzhanivskyy, V.B. Rashkovetsky, L.V. |
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| Subject |
?????????? ?????????
???????? ?????????????? ????? ???? |
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| Description |
???????? ??????-??????? ??????????? (AF?-?????????????) ?????????? ???????? ??????????????? CdXHg1?XTe - Zn0.04Cd0.96Te , ?? ?????????? ?????????? ????? ? ?????? ????. ?????????? ?????????? ???????? ??????????? ???????? ?????????????????? ???????. ????????? ???????????????? ?????????, ?? ?????????????? ???? ???????? ????????? (????? ????? ?? ???????????????? ???? ?????????????). ???????? ?????????? ???????? (?-????????) ???????? ???????????????. ?????????? ??????? ????????????????? ?????????? ?????, ??? ?????????? ? ??????, ? ???????????? ??????????? ????????????? ???????? ?? ?????? ?????????????????? ???????? ?3?5, ???????? ????? ???????? ????????????????? ???? ??????????????? ????????? ???????? ????????????????. ???????????? ??????????? ????????? ?? ?????? ??????? ??????????? ??????? ?????? ???? ????????, ?? ???????????? ????? ????????? ????????? ?????????? ????????? ????????? ?? ???????? ??????????? ??????????????? ??????? ???????, ??? ? ?????? ????????? ?????????, ????????????? ?????? ????????? ?? ???? ????????? ???????? ???????? ?????????, ?? ?????? ?????? ? ????????? ?????????. The heterostructures surface - , which is formed from the liquid phase by precipitation, is investigated by atomic force microscopy (AFM-spectroscopy). The digital array corresponding to the surface image was treated using the methods of multifractal analysis. Multifractal parameters characterizing the state of the surface structure (Renyi?s numbers and multifractal measure of ordering) are calculated. The fractal symmetry (F-symmetry) of the heterostructure surface is discovered. The comparison of multifractal parameters of the layers investigated in this work with the same parameters of high-quality semiconductor structures based on nitrides ?3?5 showed a lower value of multifractal ordering measure of the heterocomposition surface structure. Application of fractal geometry to estimate the Gibbs free surface energy of the phase showed that the use of this geometry makes it possible to achieve a limiting magnitude of the surface thermodynamic functions of the system, which in terms of classical geometry, dramatically increase with decreasing particle size of media involved in the interfacial interaction. |
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| Date |
2016-04-20T13:00:12Z
2016-04-20T13:00:12Z 2012 |
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Article
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| Identifier |
http://eztuir.ztu.edu.ua/123456789/2982
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uk
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| Relation |
?????? ????. ?????: ???????? ?????;2(61)
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????
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