Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission
Zhytomyr State University Library
View Archive Info| Field | Value | |
| Relation |
http://eprints.zu.edu.ua/20653/
|
|
| Title |
Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission
|
|
| Creator |
Zinovchuk, A. V.
Tkachenko, A. K. |
|
| Subject |
QC Physics
|
|
| Publisher |
Springer
|
|
| Date |
2011
|
|
| Type |
Article
PeerReviewed |
|
| Format |
text
|
|
| Language |
uk
english |
|
| Identifier |
http://eprints.zu.edu.ua/20653/1/Semicnd1101024ZinovchukLO.pdf
Zinovchuk, A. V. and Tkachenko, A. K. (2011) Measurement of Surface Recombination Velocity and Bulk Lifetime in Si Wafers by the Kinetics of Excess Thermal Emission. Semiconductors, 45 (1). pp. 61-65. ISSN 1063-7826 |
|